Figure 6
From: Removing batch effects from purified plasma cell gene expression microarrays with modified ComBat
GEP80 Kaplan-Meier curves for HOVON-65. Kaplan-Meier plot of GEP80 risk for HOVON-65 data without transformation, transformed by ComBat, and transformed to the MIRT: Old Kit standard by M-ComBat. GEP80 risk for HOVON-65 data is most associated with survival when transformed to MIRT: Old Kit standard. Overall logrank p-values are included as well as 3-year survival estimates with 95% confidence intervals.