Fig. 6From: Pan-cancer analysis of systematic batch effects on somatic sequence variationsBatch-biased variants in the significantly mutated genes (SMGs). The Venn diagram shows the overlap between SMG genes and genes containing batch-biased variants. The number of variants in each gene is indicated in round brackets (left). Genes with position-matched batch-biased variants are indicated in red. Frequency of gene mutations in the pan-cancer data is shown in a bar plot (right)Back to article page