cpcount of selected patterns with respect to MIPS complexes. The average cpcount values of the selected frequent patterns and random embeddings of same topology are shown. cpcount is given as the number of different complexes or pathways an embedding of a frequent interaction pattern overlaps with. The values are computed with respect to MIPS complexes. Each embedding of a frequent pattern may have a different cpcount value. The standard deviation of the cpcount values of the embeddings of a pattern is indicated as error bars with one standard deviation in each direction. Pattern IDs represent the selected patterns shown in Figures 1 and 2.