Fig. 3From: nanite: using machine learning to assess the quality of atomic force microscopy-enabled nano-indentation dataData quality mapping. For a reference force-distance (FD) map and for two FD maps recorded near lesion sites, a-c the normalized minimum height given by the piezoelectric sensor, d-f the apparent Young’s modulus obtained with Eq. 3 (gray values are above the color range), and g-j the Extra Trees rating are shown. Each pixel represents one FD measurement. Exemplary FD curves and corresponding fits Eq. 3 whose location is indicated with white arrows in (g) are shown for k the gray matter, l the white matter, and m the section-embedding agarose. Scale bar in (c), 100 100µ mBack to article page