Fig. 1From: DRPnet: automated particle picking in cryo-electron micrographs using deep regressionArtifacts and challenges in cryoEM images. a Low contrast image (EMPIAR-10061) b Green region: non-vitreous ice contamination (EMPIAR-10005) c Green region: non-vitreous ice contamination; Yellow region: carbon film (EMPIAR-10017) d Green region: non-vitreous ice contamination; Overlapped particles (EMPIAR-10017)Back to article page